M. N. Filippov

发表

Test objects for automated dimensional measurements at the nanoscale level using a scanning electron microscope

V. P. Gavrilenko, M. N. Filippov, Yu. A. Novikov, 2009, Scanning Microscopies.

Advance in dimensional measurements of nano-objects based on defocusing of the electron probe of a scanning electron microscope

V. P. Gavrilenko, M. N. Filippov, A. V. Rakov, 2013, Optics & Photonics - NanoScience + Engineering.

Natural oxide thickness measurements on the test silicon relief pitch structure

V. P. Gavrilenko, M. N. Filippov, A. V. Rakov, 2013, Other Conferences.

Russian standards for dimensional measurements for nanotechnologies

V. P. Gavrilenko, M. N. Filippov, Yu. A. Novikov, 2009, Scanning Microscopies.

Measurements of linear sizes of relief elements in the nanometer range using an atomic force microscope

M. N. Filippov, Yu. A. Novikov, A. V. Rakov, 2007, SPIE NanoScience + Engineering.

New reference material for transmission electron microscope calibration

V. P. Gavrilenko, M. N. Filippov, A. V. Rakov, 2012, Other Conferences.

Measurements of linear sizes of relief elements in the nanometer range using a scanning electron microscope

V. P. Gavrilenko, M. N. Filippov, Yu. A. Novikov, 2007, SPIE NanoScience + Engineering.

Direct measurement of the linewidth of relief element on AFM in nanometer range

M. N. Filippov, Yu. A. Novikov, A. V. Rakov, 2008, International Conference on Micro- and Nano-Electronics.

SEM probe defocusing method of measurement of linear sizes of nanorelief elements

M. N. Filippov, Yu. A. Novikov, A. V. Rakov, 2010, International Conference on Micro- and Nano-Electronics.

Nanorelief elements in reference measures for scanning electron microscopy

M. N. Filippov, Yu. A. Novikov, A. V. Rakov, 2008, International Conference on Micro- and Nano-Electronics.

Laser ablation comparison by picosecond pulses train and nanosecond pulse

M. N. Filippov, S. Pershin, V. N. Lednev, 2015 .

Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope

V. P. Gavrilenko, M. N. Filippov, P. A. Todua, 2015 .

Reference material for transmission electron microscope calibration

M. N. Filippov, P. A. Todua, Yu. V. Ozerin, 2011 .

Electron Probe X-Ray Spectral Analysis of Nanoparticles

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2018, Inorganic Materials.

Analysis of two methods of measurement of surface potential of insulators in SEM : electron spectroscopy and X-ray spectroscopy methods

M. N. Filippov, E. I. Rau, O. Jbara, 2001 .

A new experimental approach for characterizing the internal trapped charge and electric field build up in ground-coated insulators during their e− irradiation

M. N. Filippov, E. I. Rau, O. Jbara, 2002 .

Thermal Action of an Electronic Probe with X-ray Spectral Nanoanalysis

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2017 .

Thermal Effects During Low-Voltage Electron-Probe X-Ray Spectral Microanalysis with Nanometer Localization

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2017 .

Simulation of the range of keV-energy electrons in a dielectric target upon spatial charge accumulation

M. N. Filippov, T. Kupriyanova, M. Stepovich, 2013, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.

Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

M. N. Filippov, V. Gavrilenko, M. Stepovich, 2015, Measurement Techniques.

Chemical Bond Effects on Line Intensities in Arsenic X-Ray Emission Spectrum

M. N. Filippov, T. Kupriyanova, O. I. Lyamina, 2003 .

Measurement of the Thickness Nonuniformity of Nanofilms Using an Electron Probe Method

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2016, Measurement Techniques.

Evaluation of the Component of Bias of X-Ray Microanalysis Related to Surface Relief of the Specimen

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2017, Inorganic Materials.

X-RAY FLUORESCENT DETERMINATION OF TITANIUM, ZIRCONIUM, AND CHROMIUM IN TITANIUM-ZIRCONIUM SANDS OF THE BESHPAGIRSKOE DEPOSIT

M. N. Filippov, A. Kozlov, V. Filichkina, 2022, Industrial laboratory. Diagnostics of materials.

Experimental determination of energy resolution and transmission characteristics of an electrostatic toroidal spectrometer adapted to a standard scanning electron microscope

M. N. Filippov, E. I. Rau, D. Berger, 1999 .

Simultaneous Determination of the Concentration of Elements and Their Speciation in Solid Samples Using X-ray Fluorescence Spectrometry

M. N. Filippov, T. Kupriyanova, O. I. Lyamina, 2001 .

Direct X-ray fluorescence determination of platinum and rhodium in used ceramic-based autocatalysts

M. N. Filippov, Y. Karpov, T. Kupriyanova, 2014, Inorganic Materials.

An X-ray Fluorescence Determination of Platinum and Rhodium in Autocatalysts on a Ceramic Base

M. N. Filippov, Y. Karpov, T. Kupriyanova, 2013 .

The possibility of using the additions method for the x-ray fluorescence determination of platinum and rhodium in spent ceramic-based autocatalysts with the sample converted into a powder and the addition of liquids

M. N. Filippov, Udc, Y. Karpov, 2013 .

On the possibility of using recursive trigonometric functions to calculate the distribution of nonequilibrium minority charge carriers in a two-layer semiconductor material

M. N. Filippov, A. M. Makarenkov, M. Stepovich, 2015, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.

Interlayer Dilution Zone Elemental Profiling and Microhardness Measurements for Individual Laser Clads

M. N. Filippov, M. Grishin, A. Stavertiy, 2020, Physics of Metals and Metallography.

Use of models of secondary X-ray fluorescence spectra to determine the measurement conditions in X-ray spectral methods of material analysis

M. N. Filippov, M. Stepovich, A. Romanov, 2017, Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques.

Elemental profiling of laser cladded multilayer coatings by laser induced breakdown spectroscopy and energy dispersive X-ray spectroscopy

M. N. Filippov, A. F. Bunkin, S. Pershin, 2017 .

Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopy.

M. N. Filippov, A. Boyde, R. A. Sennov, 2006, Scanning.

Solved and Unsolved Problems of the Metrology of Chemical Analysis

M. N. Filippov, V. B. Baranovskaya, Y. Karpov, 2019, Journal of Analytical Chemistry.

Test object for calibrating the transmission electron microscope

M. N. Filippov, P. A. Todua, Yu. V. Ozerin, 2013 .

Experimental Study of Three-Dimensional Reconstruction of Relief Structures from Stereo Images Obtained in a Scanning Electron Microscope

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2016 .

Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2016 .

Rhenium and platinum recovery from platinum and rhenium catalysts used

M. N. Filippov, V. A. Krenev, T. Kupriyanova, 2009 .

Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2015 .