Christina Seidleck

发表

Evaluation of the Radiation Susceptibility of a 3D NAND Flash Memory

Edward P. Wilcox, Kenneth A. LaBel, Raymond L. Ladbury, 2017 .

Single event upsets in the dual-port-board SRAMs of the MPTB experiment

Paul W. Marshall, Cheryl J. Marshall, Robert A. Reed, 1999 .

Heavy-Ion Testing of the Freescale Qorivva 32-bit Automotive-Grade MCU

K. A. LaBel, Megan C. Casey, Christina Seidleck, 2016 .

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Kenneth A. LaBel, Christina Seidleck, A. K. Moran, 1995 .

Independent Single Event Upset Testing of the Xilinx V5QV

Kenneth A. LaBel, Hak Kim, Anthony M. Phan, 2014 .

An Analysis of Heavy-Ion Single Event Effects for a Variety of Finite State-Machine Mitigation Strategies

Kenneth A. LaBel, Hak Kim, Anthony M. Phan, 2014 .

Preliminary Flight Results of the Microelectronics and Photonics Test Bed: NASA DR1773 Fiber Optic Data Bus Experiment

Kenneth A. LaBel, Paul W. Marshall, Cheryl J. Marshall, 1998 .

Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices

Jonathan A. Pellish, Michael J. Campola, K. LaBel, 2015 .

Assessing the impact of the space radiation environment on parametric degradation and single-event transients in optocouplers

Paul W. Marshall, C. Poivey, Cheryl J. Marshall, 2001 .

Test methodology for characterizing the SEE response of a commercial IEEE 1394 serial bus (FireWire)

K. A. LaBel, S. P. Buchner, Paul W. Marshall, 2002 .