C. Marques

Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions

Paulo F. Butzen, Cristina Meinhardt, Cleiton Magano Marques, 2021, Journal of Electronic Testing.

A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons

F. Wrobel, A. Michez, J. Boch, 2024, Eng.

An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

F. Wrobel, F. Saigné, Y. Aguiar, 2022, Electronics.