C. Ouyang

In-line yield prediction methodologies using patterned wafer inspection information

Andrzej J. Strojwas, Wojciech Maly, R. K. Nurani, 1998 .

Detection of an antenna effect in VLSI designs

Wojciech Maly, Sury Maturi, Subhendra Ghosh, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Extraction of critical areas for opens in large VLSI circuits

Wojciech Maly, Witold A. Pleskacz, Charles H. Ouyang, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Design-manufacturing interface: Part II - applications

Wojciech Maly, P. Simon, Pranab K. Nag, 1998, DATE.