C. Giri

Scan Flip-Flop Ordering with Delay and Power Minimization during Testing

C. Giri, B.N. Kumar, S. Chattopadhyay, 2005, 2005 Annual IEEE India Conference - Indicon.

Test Vector Ordering For Power Reduction During Transmission of Compressed Test Patterns To Embedded System-On-Chip

S. Chattopadhyay, C. Giri, N. Reddy Cheruku, 2006, 2006 Annual IEEE India Conference.

Modelling, detection and diagnosis of multiple faults in cross referencing DMFBs

H. Rahaman, P. Roy, P. Dasgupta, 2012, 2012 International Conference on Informatics, Electronics & Vision (ICIEV).

Testing 3D stacked ICs for post-bond partial/complete stack

Surajit Kumar Roy, C. Giri, H. Rahman, 2012, 2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS).

Scan Power Reduction Through Scan Architecture Modification And Test Vector Reordering

S. Chattopadhyay, C. Giri, P.K. Choudhary, 2007, 16th Asian Test Symposium (ATS 2007).

Fuzzy communication model for sensors in Wireless Sensor Network

C. Giri, S. Bhowmik, S. Bhowmik, 2012, 2012 International Conference on Communications, Devices and Intelligent Systems (CODIS).

Power Optimized Dictionary Coding for Test Data Compression

S. Chattopadhyay, C. Giri, 2006, 2006 IEEE International Conference on Industrial Technology.