Ives Rey-Otero

Is Repeatability an Unbiased Criterion for Ranking Feature Detectors?

Ives Rey-Otero, Mauricio Delbracio, 2015, SIAM J. Imaging Sci..

Comparing feature detectors: A bias in the repeatability criteria

Jean-Michel Morel, Ives Rey-Otero, Mauricio Delbracio, 2014, 2015 IEEE International Conference on Image Processing (ICIP).

Anatomy of the SIFT Method

Ives Rey-Otero, Mauricio Delbracio, M. Delbracio, 2014, Image Process. Line.

An analysis of scale-space sampling in SIFT

Jean-Michel Morel, Ives Rey-Otero, Mauricio Delbracio, 2014, 2014 IEEE International Conference on Image Processing (ICIP).

An Analysis of the Factors Affecting Keypoint Stability in Scale-Space

Jean-Michel Morel, Ives Rey-Otero, Mauricio Delbracio, 2016, Journal of Mathematical Imaging and Vision.

Computing an Exact Gaussian Scale-Space

Ives Rey-Otero, Mauricio Delbracio, 2016, Image Process. Line.

Variations on the Convolutional Sparse Coding Model

Michael Elad, Ives Rey-Otero, Jeremias Sulam, 2020, IEEE Transactions on Signal Processing.

Variations on the CSC model

Michael Elad, Ives Rey-Otero, Jeremias Sulam, 2018 .

Analysis dictionary learning for scene classification

Liyi Dai, Hamid Krim, Ives Rey-Otero, 2016, 2016 IEEE Statistical Signal Processing Workshop (SSP).