Sameer Haddad

Transistors with floating roadblockers as selector gates use forming nand flash memory and bias method to

Yu Sun, Chi Chang, Chung-You Hu, 1997 .

Advancement in Charge-Trap Flash memory technology

Mark Randolph, Yu Sun, Yoram Betser, 2013, 2013 5th IEEE International Memory Workshop.

Source side with two selection transistors connected nand-floating gate memory cell and programming method

Quang Le, Pau-Ling Chen, Charles Hollmer, 1998 .

Differentiating impacts of hole trapping vs. interface states on TDDB reduction in thin oxide gated diode structures

Sameer Haddad, Y. Tang, C. Chang, 1993, 31st Annual Proceedings Reliability Physics 1993.

Dynamic behavior of negative charge trapping in thin silicon oxide

Sameer Haddad, S. Haddad, Sal Cagnina, 1989 .

Flash EPROM endurance simulation using physics-based models

Jack Zezhong Peng, Sameer Haddad, Jih Lien, 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.