Miro Cupac
发表
Luca Benini,
Federico Angiolini,
Paresh Limaye,
2010,
IEEE Journal of Solid-State Circuits.
Paresh Limaye,
Bart Vandevelde,
Eric Beyne,
2010,
2010 IEEE International Solid-State Circuits Conference - (ISSCC).
Paresh Limaye,
Bart Vandevelde,
Eric Beyne,
2010,
Proceedings of 2010 International Symposium on VLSI Technology, System and Application.
Paresh Limaye,
Bart Vandevelde,
Eric Beyne,
2010,
IEEE Custom Integrated Circuits Conference 2010.
Test structures for characterization of thermal-mechanical stress in 3D stacked IC for analog design
Vladimir Cherman,
Michal Rakowski,
Abdelkarim Mercha,
2010,
2010 International Conference on Microelectronic Test Structures (ICMTS).
Bjorn De Sutter,
Steven Dupont,
Hong-Seok Kim,
2006,
ARC.