Alan Tan

Prediction of Electrical and Physical Failure Analysis Success Using Artificial Neural Networks

Hao Hu, Lin Zhao, Jeffrey Lam, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Fault isolation of digital scan logic without ‘scan diagnosis’

Hu Hao, Jeffrey Lam, S. H. Goh, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success

Hao Hu, Lin Zhao, S. H. Goh, 2019, Microelectronics Reliability.

BRISK - research-oriented storage kit for biology-related data

Alan Tan, Ben W. Tripp, Denise Daley, 2011, Bioinform..

A detailed analysis scheme to interpret multiple photon emissions micrograph for improved diagnostic resolution on open defects

Hu Hao, Jeffrey Lam, S. H. Goh, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).