Thomas A. Germer

发表

Polarized light diffusely scattered under smooth and rough interfaces

Thomas A. Germer, T. Germer, 2003, SPIE Optics + Photonics.

BIOPHYSICS AND COMPUTATIONAL BIOLOGY, ASTRONOMY

Thomas A. Germer, William B. Sparks, James H. Hough, 2009 .

SCATMECH: Polarized Light Scattering C++ Class Library, Version 2.00, software and documentation

Thomas A. Germer, 1996 .

Polarized single-scattering phase function determined for a common reflectance standard from bidirectional reflectance measurements

Thomas A. Germer, T. Germer, 2018, Commercial + Scientific Sensing and Imaging.

Modeling the effect of line profile variation on optical critical dimension metrology

Thomas A. Germer, T. Germer, 2007, SPIE Advanced Lithography.

Truncated singular value decomposition method for calibrating a Stokes polarimeter

Jessica C. Ramella-Roman, Thomas A. Germer, Bruno Boulbry, 2007, SPIE Optical Engineering + Applications.

Simulations of Optical Microscope Images, ed. by C.N. Archie

Egon Marx, Thomas A. Germer, 2006 .

Measurement of the 100 nm NIST SRM 1963 by laser surface light scattering

Thomas A. Germer, Sheryl H. Ehrman, George W. Mulholland, 2002, SPIE Optics + Photonics.

Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces

Thomas A. Germer, Martin Foldyna, Zuzana Mrazkova, 2016, Optical Engineering + Applications.

Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically generated microrough silicon

Thomas A. Germer, Bradley W. Scheer, 1998, Optics & Photonics.

Modeling the appearance of special effect pigment coatings

Thomas A. Germer, Maria E. Nadal, T. Germer, 2001, Optics + Photonics.

Measurement of lithographic overlay by light-scattering ellipsometry

Thomas A. Germer, 2002, SPIE Optics + Photonics.

High sensitivity measurements of the scattering dispersion of phantoms using spectral domain optical coherence tomography

Tasshi Dennis, Thomas E. Milner, Thomas A. Germer, 2006, SPIE BiOS.

In situ measurement of annealing-induced line shape evolution in nanoimprinted polymers using scatterometry

Thomas A. Germer, Christopher L. Soles, Lee J. Richter, 2009, Advanced Lithography.

Progress toward traceable nanoscale optical critical dimension metrology for semiconductors

Heather Patrick, Thomas A. Germer, H. Patrick, 2007, SPIE Optical Engineering + Applications.

Mueller matrix ellipsometry of artificial non-periodic line edge roughness in presence of finite numerical aperture

Thomas A. Germer, Brent C. Bergner, Martin Foldyna, 2011, Advanced Lithography.

Effect of bandwidth and numerical aperture in optical scatterometry

Heather Patrick, Thomas A. Germer, 2010, Advanced Lithography.

A spectroscopic polarimeter for detecting chiral signatures in astrobiological samples

Baoliang Wang, Thomas A. Germer, William B. Sparks, 2009, Optical Engineering + Applications.

Modeling the effect of finite size gratings on scatterometry measurements

Heather Patrick, Thomas A. Germer, Michael W. Cresswell, 2008, SPIE Advanced Lithography.

Simulations of optical microscope images

Egon Marx, Thomas A. Germer, E. Marx, 2006, SPIE Advanced Lithography.

Tunable supercontinuum fiber laser source for BRDF measurements in the STARR II gonioreflectometer

Heather Patrick, Thomas A. Germer, Benjamin K. Tsai, 2012, Other Conferences.

Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards

Heather Patrick, Thomas A. Germer, H. Patrick, 2011, Optical Engineering + Applications.

The NIST Robotic Optical Scatter Instrument (ROSI) and its application to BRDF measurements of diffuse reflectance standards for remote sensing

Heather Patrick, Thomas A. Germer, Clarence J. Zarobila, 2013, Optics & Photonics - Optical Engineering + Applications.

Modeling, Measurement, and Standards for Wafer Inspection, Government Microcircuits Applications and Critical Technologies

Thomas A. Germer, John C. Stover, George W. Mulholland, 2003 .

Preface and Introduction | NIST

Thomas A. Germer, Benjamin K. Tsai, Joanne C. Zwinkels, 2014 .

Assessing consistency of a Mueller matrix measurement by rotation of the sample under test

Thomas A. Germer, 2013, Optics & Photonics - Optical Engineering + Applications.

Hemispherical imaging of skin with polarized light

Jessica C. Ramella-Roman, Thomas A. Germer, Bruno Boulbry, 2007, Saratov Fall Meeting.

A novel hemispherical spectro-polarimetric scattering instrument for skin lesion imaging

Jessica C. Ramella-Roman, Thomas A. Germer, Bruno Boulbry, 2006, SPIE BiOS.

Extraction of trench geometry and linewidth of nanoscale grating targets in (110)-oriented silicon using angle-resolved scatterometry

Heather Patrick, Huai Huang, Thomas A. Germer, 2008, NanoScience + Engineering.

Depolarization in diffusely scattering media

Thomas A. Germer, T. Germer, 2021, BiOS.

Spatial frequency domain Mueller matrix imaging

Thomas A. Germer, Joseph Chue-Sang, Jeeseong Hwang, 2021, BiOS.

Remote Sensing of Chiral Signatures on Mars

Thomas A. Germer, Ludmilla Kolokolova, Frank Robb, 2012, 1209.0671.

Relaxation behavior of polymer structures fabricated by nanoimprint lithography.

Thomas A. Germer, Christopher L. Soles, Jack F. Douglas, 2007, ACS nano.

Compact and robust method for full Stokes spectropolarimetry.

Thomas A. Germer, Frans Snik, John MacKenty, 2012, Applied optics.

Polarization of Light Scattered by Spheres on Dielectric Layers on Silicon, ed by P.T. Chen Pages: Z.H. Gu, and A.A. Maradudin

Thomas A. Germer, George W. Mulholland, Li Piin Sung, 1999 .

Modeling and Analysis of Scatterometry Signatures for Optical Critical Dimension Reference Material Applications

Richard A. Allen, Heather Patrick, Ronald G. Dixson, 2007 .

Polarization of light scattered by microrough surfaces and subsurface defects

Thomas A. Germer, Clara C. Asmail, T. Germer, 1999 .

Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements

Thomas A. Germer, Clara C. Asmail, T. Germer, 1999 .

Optical critical dimension measurement of silicon grating targets using back focal plane scatterfield microscopy

Heather Patrick, Bryan M. Barnes, Ronald G. Dixson, 2008 .

Display Reflectance Model Based on the BRDF

Edward F. Kelley, Thomas A. Germer, George R. Jones, 1998 .

MODELING , MEASUREMENT , AND STANDARDS FOR WAFER INSPECTION

Thomas A. Germer, George W. Mulholland, 2003 .

Nanoscale Measurements with a Through-Focus Scanning-Optical-Microscope | NIST

Richard M. Silver, Thomas A. Germer, Ravikiran Attota, 2009 .

Generalized ellipsometry of artificially designed line width roughness

Ronald G. Dixson, Thomas A. Germer, Brent C. Bergner, 2011 .

Characterizing interfacial roughness by light scattering ellipsometry

Thomas A. Germer, 2001 .

Scatterometry for in situ measurement of pattern reflow in nanoimprinted polymers

Heather Patrick, Thomas A. Germer, Christopher L. Soles, 2008 .

Realizable differential matrices for depolarizing media.

Thomas A. Germer, T. Germer, 2012, Optics letters.

Polarized optical scattering signatures from biological materials

Thomas A. Germer, William B. Sparks, Charles S. Cockell, 2010 .

A Goniometric Optical Scatter Instrument for Bidirectional Reflectance Distribution Function Measurements with Out-of-plane and Polarimetry Capabilities, ed. by Z.H. Gu and A.A. Maradudin

Thomas A. Germer, Clara C. Asmail, 1997 .

Specular and Diffuse Reflection Measurements of Electronic Displays | NIST

Edward F. Kelley, Thomas A. Germer, George R. Jones, 1996 .

Circular polarization in scattered light as a possible biomarker

Thomas A. Germer, William B. Sparks, Shiladitya DasSarma, 2009 .