Yannick Rey-Tauriac

High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology

Olivier Bonnaud, M. Taurin, Yannick Rey-Tauriac, 2001, Microelectron. Reliab..

Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology

Olivier Bonnaud, Xavier Gagnard, Yannick Rey-Tauriac, 2001, Microelectron. Reliab..

Reliability improvement of high value doped polysilicon-based resistors

Olivier Bonnaud, E. Carvou, R. Rogel, 2002, Microelectron. Reliab..

Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology

D. Lachenal, Alain Bravaix, Yannick Rey-Tauriac, 2005, Microelectron. Reliab..

Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology

Olivier Bonnaud, M. Taurin, Yannick Rey-Tauriac, 2003, Microelectron. Reliab..

Degradation mechanism understanding of NLDEMOS SOI in RF applications

Frederic Monsieur, D. Lachenal, Alain Bravaix, 2007, Microelectron. Reliab..

Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS

Olivier Bonnaud, M. Taurin, Yannick Rey-Tauriac, 2001, Microelectron. Reliab..