R. Lackmann

An approach to liquid crystal voltage contrast test system

M. Wieberneit, R. Lackmann, 1995 .

Trends in VLSI technologies

Holger Vogt, Günter Zimmer, R. Lackmann, 1990 .

PROGEN: a program generator to generate conversion programs for test patterns

R. Lackmann, C. Schmitz, T. Rennett, 1992, [1992] Conference Record IEEE Instrumentation and Measurement Technology Conference.

KUSET - Knowledge Based User Support for Electron Beam Testing

R. Lackmann, G. Weichert, 1992, IEA/AIE.

Modular CAD environment for contactless test systems

R. Lackmann, J. Fritz, 1990 .

A charge compensation method for measuring passivated devices with high extraction voltage

R. Lackmann, G. Weichert, R. Lackmann, 1992 .

Optical beam induced currents in MOS transistors

R. Lackmann, J. Fritz, 1990 .