Insaf Lahbib

Reliability analysis of low noise amplifiers for wireless applications under high RF power stressing

Philippe Descamps, Patrice Gamand, Dominique Lesenechal, 2017, 2017 International Conference on Advanced Technologies for Communications (ATC).

Hot carrier injection and negative bias temperature instability induced NMOS and PMOS degradation on CMOS Ring Oscillator

Guy Imbert, Insaf Lahbib, Patrick Martin, 2016, 2016 Annual Reliability and Maintainability Symposium (RAMS).

RF Small and large signal characterization of a 3D integrated GaN/RF-SOI SPST switch

G. U'ren, B. Grandchamp, Ousmane Sow, 2021, International Journal of Microwave and Wireless Technologies.

RF SPST Switch Based on Innovative Heterogeneous GaN/SOI Integration Technique

B. Grandchamp, Ousmane Sow, J. Loraine, 2021, 2020 15th European Microwave Integrated Circuits Conference (EuMIC).

Optimal hybridization and amortized cost study of battery/supercapacitors system under pulsed loads

Amine Lahyani, Pascal Venet, Ali Sari, 2016 .