Shifeng Lu

Materials and physical properties of novel high-k and medium-k gate dielectrics

D. Gilmer, B. Nguyen, R. Droopad, 2001 .

Characterization of the negative Poisson's ratio effect of the thermal-damaged crystalline rock by the grain-based model

T. Zhao, D. Ding, Ling Xu, 2023, International Journal of Rock Mechanics and Mining Sciences.

High depth resolution Secondary Ion Mass Spectrometry (SIMS) analysis of Si1−xGex:C HBT structures

S. Zollner, Wei Chen, M. Kottke, 2001 .