R. Kazerounian

A floating gate method for MOS transistor gate capacitance and Leff measurements and its implementation in a parametric test

R. Kazerounian, A. Singh, B. Eltan, 1989, Proceedings of the 1989 International Conference on Microelectronic Test Structures.

Alternate metal virtual ground (AMG)-a new scaling concept for very high-density EPROMs

B. Eitan, R. Kazerounian, A. Bergemont, 1991, IEEE Electron Device Letters.