R. Evazians

Test circuits for characterizing power transistors in ZVS and ZCS circuits

Krishna Shenai, Malay Trivedi, R. Evazians, 1998, IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222).

A novel base drive circuit for accurate measurement and modeling of high-speed power bipolar transistors

Krishna Shenai, Malay Trivedi, R. Evazians, 1998, IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222).