Glenn H. Chapman

Israel Koren, Glenn H. Chapman, Zahava Koren, 2014, 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

On-line identification of faults in fault-tolerant imagers

Israel Koren, Jozsef Dudas, Cory Jung, 2005, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05).

Advanced fault-tolerance techniques for a color digital camera-on-a-chip

Israel Koren, Glenn H. Chapman, Zahava Koren, 2001, Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

3D heterogeneous sensor system on a chip for defense and security applications

Glenn H. Chapman, Eby G. Friedman, Yehea Ismail, 2004, SPIE Defense + Commercial Sensing.

Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors

Glenn H. Chapman, Vijay K. Jain, Bonnie L. Gray, 2011, 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.

Angular domain fluorescent lifetime imaging in turbid media

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2009, BiOS.

Guest Editorial Foreword to the Special Section on WSI'95

Glenn H. Chapman, Stuart K. Tewksbury, 1997, IEEE Trans. Very Large Scale Integr. Syst..

Improving the accuracy of the bimetallic grayscale photomasks using a feedback controlled flat-top beam

Glenn H. Chapman, Reza Qarehbaghi, Waris Boonyasiriwat, 2011, Photomask Technology.

A highly reconfigurable computing array: DSP plane of a 3D heterogeneous SoC

Glenn H. Chapman, Sanjukta Bhanja, Vijay K. Jain, 2005, Proceedings 2005 IEEE International SOC Conference.

Enhanced correction methods for high density hot pixel defects in digital imagers

Israel Koren, Glenn H. Chapman, Zahava Koren, 2015, Electronic Imaging.

Defect Tolerance for a Capacitance Based Nanoscale Biosensor

Glenn H. Chapman, Vijay K. Jain, 2008, 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems.

Detecting SEUs in Noisy Digital Imagers with small pixels

Glenn H. Chapman, Zahava Koren, Hao Yang, 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Defect and Fault Tolerance in VLSI Systems

Glenn H. Chapman, Regis Leveugle, 2003 .

Defect avoidance in a 3-D heterogeneous sensor [acoustic/seismic/active pixel/IR imaging sensor array]

Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali, 2004 .

Laser defect correction applications to FPGA based custom computers

Glenn H. Chapman, Benoit Dufort, 1997, Proceedings. The 5th Annual IEEE Symposium on Field-Programmable Custom Computing Machines Cat. No.97TB100186).

Expanding grayscale capability of direct-write grayscale photomask by using modified Bi/In compositions

Glenn H. Chapman, Michelle L. La Haye, David K. Poon, 2005, SPIE Photomask Technology.

Massively Deployable Intelligent Sensors for the Smart Power Grid

Glenn H. Chapman, Vijay K. Jain, 2010, 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems.

Contrast and resolution analysis of angular domain imaging for iterative optical projection tomography reconstruction

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2010, BiOS.

Detection of low-concentration ammonia using differential laser-induced fluorescence on vapochromic coordination polymers

Glenn H. Chapman, Bonnie Gray, Dawei Yin, 2018, OPTO.

Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels

Israel Koren, Glenn H. Chapman, Zahava Koren, 2018, 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

A Multiprocessor System-on-Chip Implementation of a Laser-based Transparency Meter on an FPGA

Glenn H. Chapman, James Dykes, Lesley Shannon, 2007, 2007 International Conference on Field-Programmable Technology.

Improved image accuracy in Hot Pixel degraded digital cameras

Israel Koren, Glenn H. Chapman, Zahava Koren, 2013, 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).

Analyzing the impact of ISO on digital imager defects with an automatic defect trace algorithm

Israel Koren, Glenn H. Chapman, Zahava Koren, 2010, Electronic Imaging.

Identification of in-field defect development in digital image sensors

Israel Koren, Jozsef Dudas, Cory Jung, 2007, Electronic Imaging.

Angle-resolved spectroscopy using a radial angular filter array

Glenn H. Chapman, Haishan Zeng, Bozena Kaminska, 2010, BiOS.

Enhanced inorganic bimetallic thermal resists transparency and resolution for photomask fabrication

Glenn H. Chapman, Jun Wang, Karen L. Kavanagh, 2005, SPIE Advanced Lithography.

Spatiofrequency filter in turbid medium enhanced by background scattered light subtraction from a deviated laser source

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2009, BiOS.

Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies

Jozsef Dudas, Cory Jung, Glenn H. Chapman, 2006, 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Quantitative analysis of in-field defects in image sensor arrays

Israel Koren, Jozsef Dudas, Glenn H. Chapman, 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).

On-Line Mapping of In-Field Defects in Image Sensor Arrays

Israel Koren, Jozsef Dudas, Cory Jung, 2006, 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Angular domain image detectability with changing turbid medium scattering coefficients

Jozsef Dudas, Glenn H. Chapman, Nick Pfeiffer, 2005, SPIE BiOS.

Bimetallic grayscale photomasks written using flat-top beam vs. Gaussian beam

Glenn H. Chapman, Reza Qarehbaghi, Waris Boonyasiriwat, 2012, LASE.

Laser interconnection techniques for defect avoidance in large-area restructurable silicon systems

Glenn H. Chapman, 1992 .

Simulating enhanced photo carrier collection in the multifinger photogate active pixel sensors

Glenn H. Chapman, Phanindra Kalyanam, Ash M. Parameswaran, 2011, Electronic Imaging.

Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays

Glenn H. Chapman, Benoit Dufort, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Angular domain optical projection tomography in turbid media

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2009, BiOS.

Inter-plane via defect detection using the sensor plane in 3D heterogeneous sensor systems

Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali, 2005, 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05).

Level-hybrid optoelectronic TESH interconnection network

Glenn H. Chapman, Vijay K. Jain, 2003, Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems.

BiIn: a sensitive bimetallic thermal resist

Glenn H. Chapman, Marinko V. Sarunic, Richard Y. Tu, 2001, SPIE Advanced Lithography.

Creation of embedded structures in SU-8

Glenn H. Chapman, Jun Wang, Dan Sameoto, 2007, SPIE MOEMS-MEMS.

Characterizing long lived intralipid-infused tissue phantoms scattering using imaging sensors

Glenn H. Chapman, Sean Paulsen, Yutian Zhang, 2020, BiOS.

Characterization of pixel defect development during digital imager lifetime

Israel Koren, Jozsef Dudas, Glenn H. Chapman, 2008, Electronic Imaging.

Using Laser Defect Avoidance to Build Large-Area FPGAs

Glenn H. Chapman, Benoit Dufort, 1998, IEEE Des. Test Comput..

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation

Glenn H. Chapman, Zahava Koren, Israel Koren, 2020, 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Tradeoffs in Imager Design with Respect to Pixel Defect Rates

Israel Koren, Glenn H. Chapman, Zahava Koren, 2010, 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems.

The implementation and spectrum response analysis of multi-finger photogate APS pixels

Glenn H. Chapman, M. Parameswaran, Jenny Leung, 2009, Electronic Imaging.

A wafer scale dynamic thermal scene generator

Glenn H. Chapman, M. Parameswaran, Marek Syrzycki, 1992, [1992] Proceedings International Conference on Wafer Scale Integration.

Design of a large area magnetic field sensor array

Glenn H. Chapman, Y. Audet, 1994, Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI).

Inorganic Bi/In thermal resist as a high-etch-ratio patterning layer for CF4/CHF3/O2 plasma etch

Glenn H. Chapman, Jun Peng, Yuqiang Tu, 2004, SPIE Advanced Lithography.

Optical imaging of structures within highly scattering material using an incoherent beam and a spatial filter

Glenn H. Chapman, Bozena Kaminska, Nick Pfeiffer, 2010, BiOS.

Creating 3D structures with a direct-write grayscale photomask made from Sn/In bimetallic films

Glenn H. Chapman, Jun Peng, Yuqiang Tu, 2004, SPIE LASE.

Angular domain imaging of phantom objects within highly scattering mediums

Glenn H. Chapman, Nick Pfeiffer, Bob Wai, 2004, SPIE BiOS.

Image contrast enhancement during time-angular domain imaging through turbid media by estimation of background scattered light

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2009, BiOS.

Creating direct-write gray-scale photomasks with bimetallic thin film thermal resists

Glenn H. Chapman, Jun Peng, Yuqiang Tu, 2003, SPIE Photomask Technology.

Relating digital imager defect rates to pixel size, sensor area and ISO

Israel Koren, Glenn H. Chapman, Zahava Koren, 2012, 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Test vehicle for a wafer-scale field programmable gate array

Glenn H. Chapman, B. Dufort, 1995, Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI).

Bimetallic grayscale photomasks written using optical density feedback control

Glenn H. Chapman, Reza Qarehbaghi, James M. Dykes, 2011, MOEMS-MEMS.

Inter-layer vias and TESH interconnection network for a 3-D heterogeneous sensor system on a chip

Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali, 2005, SPIE Defense + Commercial Sensing.

Optical imaging through non-transparent small aquatic creatures with angular-domain imaging

Glenn H. Chapman, Rongen L. K. Cheng, Polly Tsui, 2011, BiOS.

Effects of scanning and biasing circuit restructuring on the response of a large area magnetic field sensor array

Glenn H. Chapman, Y. Audet, 1997 .

Predicting Pixel Defect Rates Based on Image Sensor Parameters

Israel Koren, Glenn H. Chapman, Zahava Koren, 2011, 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.

Multispectral angular domain optical tomography in scattering media with argon and diode laser sources

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2007, SPIE BiOS.

Wafer-scale transducer arrays

Glenn H. Chapman, Marek Syrzycki, M. Parameswaran, 1992, Computer.

Comparison of laser link crossbar and Omega network switching for wafer-scale integration defect avoidance

Glenn H. Chapman, K. Fang, 1994, Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI).

Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO

Israel Koren, Glenn H. Chapman, Zahava Koren, 2013, Electronic Imaging.

Do more camera pixels result in a better picture?

Israel Koren, Glenn H. Chapman, Zahava Koren, 2012, 2012 IEEE 18th International On-Line Testing Symposium (IOLTS).

Modeling particle flow and blockages in microfluidic channels supported by periodic posts

Glenn H. Chapman, Bonnie L. Gray, Mahyar Mehran, 2014, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

Single step direct-write photomask made from bimetallic Bi/In thermal resist

Glenn H. Chapman, Richard Y. Tu, 2003, SPIE LASE.

Experimental study and analysis of soft and permanent errors in digital cameras

Israel Koren, Glenn H. Chapman, Zahava Koren, 2016, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Enhanced angular domain optical imaging by background scattered light subtraction from a deviated laser source

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2008, SPIE BiOS.

Wavelength invariant Bi/In thermal resist as a Si anisotropic etch masking layer and direct-write photomask material

Glenn H. Chapman, Jun Peng, Yuqiang Tu, 2003, SPIE Advanced Lithography.

Improving the optical characteristics of bimetallic grayscale photomasks

Glenn H. Chapman, Jun Wang, David K. Poon, 2007, SPIE LASE.

A self-correcting active pixel camera

Israel Koren, Glenn H. Chapman, Zahava Koren, 2000, Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Statistical identification and analysis of defect development in digital imagers

Israel Koren, Glenn H. Chapman, Zahava Koren, 2009, Electronic Imaging.

Creating 35 mm camera active pixel sensors

Glenn H. Chapman, Yves Audet, G. Chapman, 1999, Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99).

Single Event Upsets and Hot Pixels in digital imagers

Glenn H. Chapman, Zahava Koren, Israel Koren, 2015, 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).

Implementation and testing of fault-tolerant photodiode-based active pixel sensor (APS)

Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, 2003, Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems.

Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)

Cory Jung, Glenn H. Chapman, Sunjaya Djaja, 2004 .

Automatic Detection of In-field Defect Growth in Image Sensors

Israel Koren, Glenn H. Chapman, Zahava Koren, 2008, 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems.

Noise analysis of fault tolerant active pixel sensors with and without defects

Cory Jung, Glenn H. Chapman, Michelle L. La Haye, 2006, Electronic Imaging.

Laser-induced oxidation of Zn and Zn alloy films for direct-write grayscale photomasks

Glenn H. Chapman, Jun Wang, Jun Peng, 2006, SPIE LASE.

Enhancing direct-write laser control techniques for bimetallic grayscale photomasks

Glenn H. Chapman, James M. Dykes, Calin Plesa, 2008, SPIE MOEMS-MEMS.

Phase-sensitive techniques applied to a micromachined vacuum sensor

Glenn H. Chapman, N. Sawadsky, P. P. S. Juneja, 1996, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

Optical characterization of the mask writing process in bimetallic grayscale photomasks

Glenn H. Chapman, James M. Dykes, 2009, LASE.

Creating precise 3D microstructures using laser direct-write bimetallic thermal resist grayscale photomasks

Glenn H. Chapman, Jun Wang, Jun Peng, 2005, SPIE LASE.

A Monolithic Hough Transform Processor Based on Restructurable VLSI

Glenn H. Chapman, Jack I. Raffel, Antonio M. Soares, 1988, IEEE Trans. Pattern Anal. Mach. Intell..

Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)

Cory Jung, Glenn H. Chapman, Sunjaya Djaja, 2004, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings..

Angular domain optical imaging of turbid media using enhanced micro-tunnel filter arrays

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2009, European Conference on Biomedical Optics.

Enhancing defect tolerance in periodic post microfluidic channels

Glenn H. Chapman, Bonnie L. Gray, G. Chapman, 2016, SPIE BiOS.

Laser-induced oxidation of metallic thin films as a method for creating grayscale photomasks

Glenn H. Chapman, Jun Wang, David K. Poon, 2006, SPIE Advanced Lithography.

Bi/In as patterning and masking layers for alkaline-base Si anisotropic etching

Glenn H. Chapman, Yuqiang Tu, 2003, SPIE MOEMS-MEMS.

Laser Restructurable Technology and Design

Glenn H. Chapman, A. H. Anderson, J. I. Raffel, 1989 .

Enhanced angular domain imaging in turbid media using Gaussian line illumination

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2006, SPIE BiOS.

Defect tolerance in microfluidic chambers for capacitive biosensors

Glenn H. Chapman, Vijay K. Jain, Bonnie L. Gray, 2010, MOEMS-MEMS.

Laser correcting defects to create transparent routing for large area FPGA's

Glenn H. Chapman, Benoit Dufort, 1997, FPGA '97.

Monte Carlo simulations of the growth and decay of quasi-ballistic photon fractions with depth in an isotropic scattering medium

Glenn H. Chapman, Nick Pfeiffer, 2005, SPIE BiOS.

Bimetallic thermal activated films for microfabrication, photomasks, and data storage

Glenn H. Chapman, Marinko V. Sarunic, Richard Yuqiang Tu, 2002, SPIE LASE.

Deep illumination angular domain imaging within highly scattering media enhanced by image processing

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2006, SPIE Optics East.

Bimetallic thermal resists potential for double-exposure immersion lithography and grayscale photomasks

Glenn H. Chapman, Chinheng Choo, James M. Dykes, 2007, SPIE Photomask Technology.

A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot-Pixel Defects

Jozsef Dudas, Glenn H. Chapman, Jenny Leung, 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).

Adding grayscale layer to chrome photomasks

Glenn H. Chapman, Jun Wang, Andrew Zanzal, 2006, SPIE Photomask Technology.

Effect of time gating and polarization discrimination of propagating light in turbid media during angular domain imaging (ADI)

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2009, BiOS.

CMOS photodetector with built-in light adaptation mechanism

Glenn H. Chapman, Marek Syrzycki, Vivian Ward, 1993 .

Incoherent source angular domain imaging through complex three-dimensional scattering structures

Glenn H. Chapman, Rongen L. K. Cheng, Gary Chiang, 2012, BiOS.

Yield improvement of a large area magnetic field sensor array using redundancy schemes

Glenn H. Chapman, Yves Audet, 1997, IEEE Trans. Very Large Scale Integr. Syst..

Calibrating bimetallic grayscale photomasks to photoresist response for precise micro-optics fabrication

Glenn H. Chapman, Reza Qarehbaghi, Santiago Roche, 2014, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

Algorithmic bus and circuit layout for wafer-scale integration and multichip modules

Glenn H. Chapman, R. F. Hobson, 1993, 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration.

Real-time optical characterization of laser oxidation process in bimetallic direct write gray scale photomasks

Glenn H. Chapman, Jun Wang, David K. Poon, 2006, SPIE LASE.

Angular-domain imaging of fluorescence sources within tissue phantoms

Glenn H. Chapman, Nick Pfeiffer, Rongen L. K. Cheng, 2011, BiOS.

FPGA design for decimeter scale integration (DMSI)

Glenn H. Chapman, 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).

Angular distribution of quasi-ballistic light measured through turbid media using angular domain optical imaging

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2009, BiOS.

Correcting high-density hot pixel defects in digital imagers

Israel Koren, Glenn H. Chapman, Zahava Koren, 2014, Electronic Imaging.

Bimetallic grayscale photomasks for micro-optics fabrication using dual wavelength laser writing techniques

Glenn H. Chapman, Reza Qarehbaghi, 2012, Photomask Technology.

Wafer-scale integration defect avoidance tradeoffs between laser links and Omega network switching

Glenn H. Chapman, D. E. Bergen, K. Fang, 1995, Proceedings of International Workshop on Defect and Fault Tolerance in VLSI.

Laser applications to IC defect correction

Glenn H. Chapman, 1998, Photonics West.

Calibrating grayscale direct write bimetallic photomasks to create 3D photoresist structures

Glenn H. Chapman, Jun Peng, David K. Poon, 2004, SPIE Photomask Technology.

Characterization of Gain Enhanced In-Field Defects in Digital Imagers

Israel Koren, Glenn H. Chapman, Zahava Koren, 2009, 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Defect avoidance in a 3-D heterogeneous sensor [acoustic/seismic/active pixel/IR imaging sensor array]

Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali, 2004, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings..

Design of a self-correcting active pixel sensor

Glenn H. Chapman, Yves Audet, 2001, Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm

Israel Koren, Glenn H. Chapman, Zahava Koren, 2017, 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Optical imaging of objects within highly scattering media using silicon-micromachined collimating arrays

Glenn H. Chapman, Moninder S. Tank, Gary Chu, 2002, SPIE BiOS.

Enhanced laser-writing techniques for bimetallic grayscale photomasks

Glenn H. Chapman, James M. Dykes, 2009, Photomask Technology.

A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor

Glenn H. Chapman, Sanjukta Bhanja, Vijay K. Jain, 2005, Proceedings. (ICASSP '05). IEEE International Conference on Acoustics, Speech, and Signal Processing, 2005..

Effects of scanning and biasing circuit restructuring on the response of a large area magnetic field sensor array

Glenn H. Chapman, Y. Audet, G. Chapman, 1996, 1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon.

A wafer-scale digital integrator using restructurable VSLI

Glenn H. Chapman, A. H. Anderson, J. I. Raffel, 1985 .

Laser processes for defect correction in large area VLSI systems

Glenn H. Chapman, 1994, IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid

Glenn H. Chapman, Vijay K. Jain, 2011, 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.

Integrated transducer systems

Glenn H. Chapman, M. Parameswaran, Marek Syrzycki, 1995, Other Conferences.

Prototype laser-activated bimetallic thermal resist for microfabrication

Glenn H. Chapman, Marinko V. Sarunic, Richard Y. Tu, 2001, SPIE LASE.

Laser direct write patterned indium tin oxide films for photomasks and anisotropic resist applications

Glenn H. Chapman, Jun Peng, Yuqiang Tu, 2004, Photonics North.

Modeling defect tolerance sensitivity to periodic post parameters in microfluidic channels

Glenn H. Chapman, Bonnie L. Gray, Mahyar Mehran, 2015, Photonics West - Biomedical Optics.

Angular domain optical imaging of structures within highly scattering material using silicon micromachined collimating arrays

Glenn H. Chapman, Nick Pfeiffer, Gary Chu, 2003, SPIE BiOS.

Bi/In thermal resist for both Si anisotropic wet etching and Si/SiO2 plasma etching

Glenn H. Chapman, Jun Peng, Yuqiang Tu, 2004, SPIE MOEMS-MEMS.

Effects of heated substrates on bimetallic thermal resist for lithography and grayscale photomask applications

Glenn H. Chapman, Jenny Leung, Polly Tsui, 2008, Photomask Technology.

High speed lensless integrated proximity sensor

Glenn H. Chapman, D. E. Bergen, 1997, 1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon.

Angular domain spectroscopic imaging of turbid media using silicon micromachined microchannel arrays

Glenn H. Chapman, Bozena Kaminska, Fartash Vasefi, 2010, BiOS.

Laser hole drilling in thick polypropylene sheets for alignment sensors

Glenn H. Chapman, D. E. Bergen, Taranjit Singh Samra, 1996, Photonics West.

Fault Tolerance for Islandable-Microgrid Sensors

Glenn H. Chapman, Vijay K. Jain, 2021, 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Dependence of SEUs in Digital Cameras on Pixel size and Elevation

Glenn H. Chapman, Zahava Koren, Klinsmann J. Coelho Silva Meneses, 2021, 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Detecting PPM ammonia over wide range using laser induced fluorescence of vapochromic coordination polymers

Glenn H. Chapman, Bonnie Gray, Daniel Leznoff, 2021, OPTO.

Laser‐formed connections using polyimide

Glenn H. Chapman, J. I. Raffel, J. Raffel, 1983 .

Angular domain imaging of objects within highly scattering media using silicon micromachined collimating arrays

Glenn H. Chapman, Nick Pfeiffer, Maria Trinh, 2003 .

Laser-induced diode linking for wafer-scale integration. Technical report

Glenn H. Chapman, Stephen S. Cohen, Peter W. Wyatt, 1988 .

Enhanced operation of wafer-scale circuits using nitrided a-Si laser links

Glenn H. Chapman, J. A. Burns, 1986 .

Wavelength-Invariant Resist Composed of Bimetallic Layers

Glenn H. Chapman, Jun Peng, Yuqiang Tu, 2002 .

Chapter 2 - Laser Beam Processing and Wafer-Scale Integration

Glenn H. Chapman, G. Chapman, S. S. Cohen, 1989 .

Interconnection and testing of a wafer-scale circuit with laser processing

Glenn H. Chapman, A. H. Anderson, K. H. Konkle, 1984 .