P. Nagel

Investigations on chip-internal current contrast imaging and measurement using an electron beam tester

K. Helmreich, W. Wolz, K. Muller-Glaser, 1992 .

AN APPROACH TO CHIP-INTERNAL CURRENT MONITORING AND MEASUREMENT USING AN ELECTRON BEAM TESTER

Klaus D. Müller-Glaser, Klaus Helmreich, Peter Nagel, 1991, 1991, Proceedings. International Test Conference.