Erik H. Anderson

Toward sub-10-nm resolution zone plates using the overlay nanofabrication processes

Dong Hyun Kim, Weilun Chao, Erik H. Anderson, 2008, SPIE MOEMS-MEMS.

Experimental analysis of high-resolution soft x-ray microscopy

David T. Attwood, Bruce Harteneck, Gregory Denbeaux, 2001, SPIE Optics + Photonics.

Nanomechanical oscillations in a single-C60 transistor

Paul L. McEuen, Jiwoong Park, Hongkun Park, 2000, Nature.

High-resolution soft x-ray microscopy

David T. Attwood, Bruce Harteneck, Deirdre L. Olynick, 2000, SPIE Optics + Photonics.

Nanoscale ablation with soft x-ray lasers

Jorge J. Rocca, Carmen S. Menoni, David T. Attwood, 2007, SPIE Optical Engineering + Applications.

Performance of actinic EUVL mask imaging using a zoneplate microscope

Kenneth A. Goldberg, Farhad Salmassi, Eric M. Gullikson, 2007, SPIE Photomask Technology.

Novel method for silicon quantum wire transistor fabrication

Jeffrey Bokor, Erik H. Anderson, J. Kedzierski, 1999 .

Sub-50nm FinFET : PMOS

Vivek Subramanian, Jeffrey Bokor, Chenming Hu, 1999 .

Quasi-planar FinFETs with selectively grown germanium raised source/drain

Jeffrey Bokor, Chenming Hu, Leland Chang, 2001, 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207).