J.T.H. Brugman

The floating gate measurement technique for characterization of capacitor matching

H. P. Tuinhout, H. Elzinga, J.T.H. Brugman, 1996 .

Accurate capacitor matching measurements using floating gate test structures

H. P. Tuinhout, H. Elzinga, J.T.H. Brugman, 1995, Proceedings International Conference on Microelectronic Test Structures.