Hans P. Muhlfeld

Accelerated testing for cosmic soft-error rate

Huntington W. Curtis, James F. Ziegler, Hans P. Muhlfeld, 1996, IBM J. Res. Dev..

IBM experiments in soft fails in computer electronics (1978-1994)

James L. Walsh, Huntington W. Curtis, James F. Ziegler, 1996, IBM J. Res. Dev..

Field testing for cosmic ray soft errors in semiconductor memories

James L. Walsh, Huntington W. Curtis, James F. Ziegler, 1996, IBM J. Res. Dev..

Cosmic ray soft error rates of 16-Mb DRAM memory chips

Hans P. Muhlfeld, J. Ziegler, M. Nelson, 1998, IEEE J. Solid State Circuits.