James Pitarresi

Accelerated vibration reliability testing of electronic assemblies using sine dwell with resonance tracking

Gaurang Joshi, Quang Su, James Pitarresi, 2014, 2014 IEEE 64th Electronic Components and Technology Conference (ECTC).

Board level energy correlation and interconnect reliability modeling under drop impact

Brian Roggeman, James Pitarresi, Akash Agrawal, 2009, 2009 59th Electronic Components and Technology Conference.

Random vibration test for electronic assemblies fatigue life estimation

Da Yu, Seungbae Park, Abdullah Al-Yafawi, 2010, 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.

Impact of board configuration and shock loading conditions for board level drop test

James Pitarresi, Brian Roggeman, Pradosh Guruprasad, 2011, 2011 IEEE 61st Electronic Components and Technology Conference (ECTC).

Reliability assessment of electronic components under random vibration loading

Da Yu, Soonwan Chung, Abdullah Al-Yafawi, 2009, 2009 59th Electronic Components and Technology Conference.

Board-Level Drop Test : Comparison of Two ANSYS Modeling Approaches and Correlation with Testing

James Pitarresi, Martin Anselm, Mohammad Gharaibeh, 2013 .