D. Nagalingam

Fault isolation on marginal failures using dummy signals

Z. H. Mai, D. Nagalingam, S. Moon, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern

C. Q. Chen, Francis Rivai, G. B. Ang, 2017, Microelectron. Reliab..

Enhancing die level static fault isolation on power gated devices

D. Nagalingam, P. T. Ng, C. Q. Chen, 2020 .

Static fault localization of subtle metallization defects using near infrared photon emission microscopy

Jeffrey Lam, G. B. Ang, Z. H. Mai, 2017, Microelectron. Reliab..

Achieving Simplified Biasing Conditions with Pin Reduction Approach to enhance Static Fault Localization Capability

A.C.T. Quah, P.T. Ng, C.Q. Chen, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect

Jeffrey Lam, C. Q. Chen, G. B. Ang, 2017, Microelectron. Reliab..

Fault isolation on the wafer with lithography hotspot signature

C. Q. Chen, J. Lam, Francis Rivai, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

J.C.H. Phang, D. Nagalingam, C. S. Bhatia, 2010, 2010 IEEE International Reliability Physics Symposium.

Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

J.C.H. Phang, D. Nagalingam, C. S. Bhatia, 2011 .