S. L. Ting

Fault isolation on marginal failures using dummy signals

Z. H. Mai, D. Nagalingam, S. Moon, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Application of Cross-Section EBIC to Localize Junction Anomaly

P. T. Ng, S. L. Ting, C. Q. Chen, 2022, 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect

Jeffrey Lam, C. Q. Chen, G. B. Ang, 2017, Microelectron. Reliab..

Laser Deprocessing Technique and its Application to Physical Failure Analysis

S. L. Ting, C. Q. Chen, P. K. Tan, 2020 .

Advanced Physical Failure Analysis Techniques for Rescuing Damaged Samples with Cracks, Scratches, or Unevenness in Delayering

S. L. Ting, P. K. Tan, Hao Tan, 2021, Advances in Science, Technology and Engineering Systems.

Defect Prediction Approach to enhance Static Fault Localization of Functional Logic Failure Defects using NIR Photon Emission Microscopy

S. L. Ting, A. Quah, S. Neo, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).