Marc Gaillardin

发表

Multi-MGy Radiation Hardened Camera for Nuclear Facilities

Romain Molina, Pierre Magnan, Sylvain Girard, 2015 .

Implementing Realistic Heavy Ion Tracks in a SEE Prediction Tool: Comparison Between Different Approaches

Guillaume Hubert, Arnaud Bournel, Philippe Paillet, 2012, IEEE Transactions on Nuclear Science.

New source of random telegraph signal in CMOS image sensors

Pierre Magnan, Cedric Virmontois, Philippe Martin-Gonthier, 2012 .

FURHIS project: Development of MGy Radiation‐Hardened Imaging System for ITER remote handling operations

Marco Van Uffelen, Youcef Ouerdane, Pierre Magnan, 2017 .

Estimating the Single-Event Upset sensitivity of a memory array using simulation

Philippe Paillet, Marc Gaillardin, Olivier Duhamel, 2017, Microelectron. Reliab..

Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests

Romain Molina, Pierre Magnan, Sylvain Girard, 2015, IEEE Transactions on Nuclear Science.

X-Ray, Proton, and Electron Radiation Effects on Type I Fiber Bragg Gratings

Youcef Ouerdane, Sylvain Girard, Claude Marcandella, 2018, IEEE Transactions on Nuclear Science.

High tolerance to total ionizing dose of Ω-shaped gate field-effect transistors

Sorin Cristoloveanu, Olivier Faynot, C. Jahan, 2006 .

Investigations on heavy ion induced Single-Event Transients (SETs) in highly-scaled FinFETs

O. Faynot, F. Andrieu, P. C. Adell, 2015 .

Towards a generic representation of heavy ion tracks to be used in engineering SEE simulation tools

Philippe Paillet, Marc Gaillardin, Melanie Raine, 2013, 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Impact of SOI Substrate on the Radiation Response of UltraThin Transistors Down to the 20 nm Node

Olivier Faynot, Sylvain Girard, Claude Marcandella, 2013, IEEE Transactions on Nuclear Science.

Towards a Generic Representation of Heavy Ion Tracks to be Used in Engineering SEE Simulation Tools

Philippe Paillet, Marc Gaillardin, Olivier Duhamel, 2014, IEEE Transactions on Nuclear Science.

Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides

Pierre Magnan, Sylvain Girard, Claude Marcandella, 2013, IEEE Transactions on Nuclear Science.

Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments

Sylvain Girard, Cedric Virmontois, Vincent Goiffon, 2013, IEEE Transactions on Nuclear Science.

X-rays, Protons and Electrons Radiation Effects on Fiber Bragg Gratings

Youcef Ouerdane, Gerard Auriel, Sylvain Girard, 2017 .

Enhanced Radiation-Induced Narrow Channel Effects in Commercial 0 . 18 m Bulk Technology

Marc Gaillardin, 2011 .

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Olivier Marcelot, Pierre Magnan, Robin Scott, 2018, IEEE Transactions on Nuclear Science.

Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors.

Romain Molina, Pierre Magnan, Vincent Goiffon, 2016, Optics express.

Radiation-Induced Variable Retention Time in Dynamic Random Access Memories

Vincent Goiffon, Philippe Paillet, Jean-Marc Belloir, 2020, IEEE Transactions on Nuclear Science.

Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors

Romain Molina, Pierre Magnan, Magali Estribeau, 2014, IEEE Transactions on Nuclear Science.

Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments

Olivier Marcelot, Pierre Magnan, Robin Scott, 2017, IEEE Transactions on Nuclear Science.