M. Ichimiya

Applied AC Voltage for Detecting Open Leads of CMOS LSI by Monitoring Supply Current under AC Electric Field

Masaki Hashizume, Hiroyuki Yotsuyanagi, Masao Takagi, 2007 .

CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply

Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2002 .

Open Lead Detection Based on Logical Change Caused by AC Voltage Signal Stimulus

Masaki Hashizume, Hiroyuki Yotsuyanagi, Masao Takagi, 2008 .

A test circuit for pin shorts generating oscillation in CMOS logic circuits

Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004 .

Testability of Pin Open in Small Outline Package ICs by Supply Current Test

Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2003 .

Pin Open Detection for CMOS Logic ICs by Measuring Supply Current under AC Electric Field

Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2003 .

A high speed I/sub DDQ/ sensor for low-voltage ICs

Kozo Kinoshita, Masaki Hashizume, Takeomi Tamesada, 1998, Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259).

IDDQ Test Time Reduction by High Speed Charging of Load Capacitors of CMOS Logic Gates

Kozo Kinoshita, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2002 .

A High-Speed IDDQ Sensor for Low-Voltage ICs

Kozo Kinoshita, Masaki Hashizume, Takeomi Tamesada, 1998 .

Lead Open Detection Based on Supply Current of CMOS LSIs

Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, 2004 .