Marcial Jesús Rodríguez-Irago

Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2005, 11th IEEE International On-Line Testing Symposium.

Signal Integrity Enhancement in Digital Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2008, IEEE Design & Test of Computers.

Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2005, J. Electron. Test..

Dynamic fault detection in digital systems using dynamic voltage scaling and multi-temperature schemes

João Paulo Teixeira, Isabel C. Teixeira, Juan J. Rodríguez-Andina, 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).