T. W. Williams

and Defect Level for Delay Fa&s Statistical Delay Fault Coverage

E. S. Park, M. R. Mercer, T. W. Williams, 1988 .

Defect level as a function of fault coverage and yield

Francesco Corsi, T. W. Williams, S. Martino, 1993, Proceedings ETC 93 Third European Test Conference.

Code coverage, what does it mean in terms of quality?

M. R. Mercer, T. W. Williams, J. P. Mucha, 2001, Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179).

Design, commissioning and testing of IPP ground electrodes

F. S. Prabhakara, T. W. Williams, J. F. Torri, 1988 .

Aliasing probability for multiple input signature analyzers with dependent inputs

T. W. Williams, T. W. Williams, W. Daehn, 1989, Proceedings. VLSI and Computer Peripherals. COMPEURO 89.

Bounds and analysis of aliasing errors in linear feedback shift registers

Wilfried Daehn, Tom W. Williams, T. W. Williams, 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

AN ENHANCEMENT TO LSSD AND SOME APPLICATIONS OF LSSD IN RELIABILITY, AVAILABILITY, AND SERVICEABILIT

T.W. Williams, S. DasGupta, R.G. Walther, 1995, Twenty-Fifth International Symposium on Fault-Tolerant Computing, 1995, ' Highlights from Twenty-Five Years'..

A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI

Sumit DasGupta, Prabhakar Goel, Ron G. Walther, 1982, ITC.