I. Bloom

Endurance optimization in microFlash Memory Device

Paolo Pavan, Yakov Roizin, Efraim Aloni, 2000 .

CRITICAL BEHAVIOR OF THE ELECTRICAL TRANSPORT PROPERTIES IN A TUNNELING-PERCOLATION SYSTEM

I. Bloom, S. A. Sunshine, Michael B. Heaney, 1999 .

Soft breakdown current noise in ultra-thin gate oxides

Alessandro Paccagnella, Gabriella Ghidini, Andrea Cester, 2002 .

Investigation of channel hot electron injection by localized charge-trapping nonvolatile memory devices

B. Eitan, A. Shappir, I. Bloom, 2004, IEEE Transactions on Electron Devices.

Spatial characterization of localized charge trapping and charge redistribution in the NROM device

Boaz Eitan, I. Bloom, Assaf Shappir, 2004 .

Temperature Monitor: A New Tool to Profile Charge Distribution in NROM Memory Devices

L. Larcher, B. Eitan, I. Bloom, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Traps spectroscopy of the Si3Ni4 layer using localized charge-trapping nonvolatile memory device

Boaz Eitan, I. Bloom, Assaf Shappir, 2004 .

Lateral charge transport in the Nitride layer of the NROM non-volatile memory device

Yosi Shacham-Diamand, Boaz Eitan, I. Bloom, 2004 .