Diego Alfaro Robayo

(Invited) Reliability and Scaling Perspectives of HfO2-Based OxRAM

Jury Sandrini, Ismail Hammad, Carlo Cagli, 2020 .

(Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions

Etienne Nowak, Gabriel Molas, Gilbert Sassine, 2018 .

Sub-pJ consumption and short latency time in RRAM arrays for high endurance applications

Elisa Vianello, Alexandre Levisse, Mathieu Bernard, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Elucidating 1S1R operation to reduce the read voltage margin variability by stack and programming conditions optimization

Jean Michel Portal, G. Navarro, C. Carabasse, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).