Eckhard Wolfgang

Future trends in electron beam testing

Eckhard Wolfgang, E. Wolfgang, 1988 .

Automated Electron Beam Testing of VLSI Circuits

Eckhard Wolfgang, Mathias Sturm, P. Köllensperger, 1984, ITC.

Optimal Design of High Power Electronic Devices by Topology Optimization

Gerhard Wachutka, Ronald H. W. Hoppe, Peter Bohm, 2003 .

Absolute measurement of transient carrier concentration and temperature gradients in power semiconductor devices by internal IR-laser deflection

G. Deboy, Wilfrid Claeys, Eckhard Wolfgang, 1996 .

Electron beam testing

Eckhard Wolfgang, E. Wolfgang, 1986 .