David De Roest

发表

A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate

Servaas Vandenberghe, Hasan Ymeri, Bart Nauwelaers, 2002, Microprocess. Microsystems.

CAD-oriented analytical solutions for capacitance and conductance of multilayer IC interconnects

Bart Nauwelaers, Karen Maex, David De Roest, 2001 .

NEW APPROACH FOR EFFICIENT COMPUTATION OF FREQUENCY-DEPENDENT SHUNT ADMITTANCE PARAMETERS OF MULTILAYER MULTICONDUCTOR IC INTERCONNECTS

Bart Nauwelaers, Karen Maex, David De Roest, 2001 .

Methodology for propagating technology trade-offs over memory modules to the application level

Hugo De Man, Henk Corporaal, Francky Catthoor, 2003 .

Modelling the substrate skin effects in mutual RL characteristics of general asymmetric coupled interconnects

Bart Nauwelaers, Karen Maex, David De Roest, 2003 .

Effect of the depletion layer on the capacitance and inductance of MIS interconnects

Bart Nauwelaers, Karen Maex, David De Roest, 2001 .

Global interconnect trade-off for technology over memory modules to application level: case study

Hugo De Man, Henk Corporaal, Francky Catthoor, 2003, SLIP '03.

Frequency-dependent expressions for inductance and resistance of microstrip line on silicon substrate

Servaas Vandenberghe, Bart Nauwelaers, Karen Maex, 2002 .

New approach for calculation of line parameters of IC interconnects

Bart Nauwelaers, Hasan Ymeri, Karen Maex, 2001 .

A new approach for the calculation of line capacitances of two-layer IC interconnects

Bart Nauwelaers, Bart Nauwelaers, Karen Maex, 2000 .

Frequency-Dependent Line Capacitance and Conductance Calculations of On-Chip Interconnects on Silicon Substrate Using Fourier cosine Series Approach

Bart Nauwelaers, Servaas Vandenberghe, Hasan Ymeri, 2001 .

Simple and efficient approach for shunt admittance parameters calculations of VLSI on-chip interconnects on semiconducting substrate

Servaas Vandenberghe, Hasan Ymeri, Bart Nauwelaers, 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

Interconnect exploration for future wire dominated technologies

Hugo De Man, Henk Corporaal, Francky Catthoor, 2002, SLIP '02.

New closed-form expression for frequency-dependent mutual impedance of coupled interconnects on lossy silicon substrate

Bart Nauwelaers, Karen Maex, David De Roest, 2001 .

Quasi-TEM approach for shunt admittance parameters calculations of VLSI on-chip interconnects

Bart Nauwelaers, Karen Maex, David De Roest, 2003 .

Broadband impedance parameters of symmetric coupled coplanar CMOS interconnects

Bart Nauwelaers, Karen Maex, David De Roest, 2003 .

Influence of porosity on electrical properties of low-k dielectrics

David De Roest, Larry Zhao, Gerald Beyer, 2012 .

Integration and Dielectric Reliability of 30 nm Half Pitch Structures in Aurora\textregistered LK HM

David De Roest, Nancy Heylen, Herbert Struyf, 2010 .

NEW ANALYTIC FORMULAS FOR SERIES MUTUAL IMPEDANCE COMPONENT CALCULATIONS OF COUPLED INTERCONNECTS ON LOSSY SILICON SUBSTRATE

Bart Nauwelaers, Karen Maex, David De Roest, 2001 .

Distributed inductance and resistance per unit length formulas for VLSI interconnects

Bart Nauwelaers, Servaas Vandenberghe, Karen Maex, 2001 .