Nishad Patil

Prognostics of Insulated Gate Bipolar Transistors

Nishad Patil, 2011 .

Anomaly detection of non punch through insulated gate bipolar transistors (IGBT) by robust covariance estimation techniques

Michael Pecht, Nishad Patil, Diganta Das, 2010, 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH).

A fusion approach to IGBT power module prognostics

M. Pecht, D. Das, Hua Lu, 2009, EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.

Anomaly detection for IGBTs using Mahalanobis distance

Michael G. Pecht, Nishad Patil, Diganta Das, 2015, Microelectron. Reliab..

Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics

Michael G. Pecht, Nishad Patil, Diganta Das, 2010, ISPE CE.