R. S. L. Moriello
发表
Leopoldo Angrisani,
Rosario Schiano Lo Moriello,
L. Angrisani,
2006,
IEEE Transactions on Instrumentation and Measurement.
L. Angrisani,
A. Baccigalupi,
Rosario Schiano Lo Moriello,
2004,
IEEE Transactions on Instrumentation and Measurement.
L. Angrisani,
R. Schiano Lo Moriello,
M. D'Urso,
2012,
2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings.
Pasquale Arpaia,
Leopoldo Angrisani,
Francesco Bonavolontà,
2018,
IEEE Instrumentation & Measurement Magazine.
Francesco Fabbrocino,
Leopoldo Angrisani,
Francesco Bonavolontà,
2017,
Sensors.
Francesco Bonavolontà,
Rosario Schiano Lo Moriello,
Annarita Tedesco,
2017,
2017 IEEE International Workshop on Measurement and Networking (M&N).
Pasquale Arpaia,
Leopoldo Angrisani,
Francesco Bonavolontà,
2017,
2017 IEEE International Workshop on Measurement and Networking (M&N).
Francesco Fabbrocino,
Leopoldo Angrisani,
Francesco Bonavolontà,
2017,
2017 IEEE 3rd International Forum on Research and Technologies for Society and Industry (RTSI).
Giorgio de Alteriis,
D. Accardo,
F. D. Prete,
2023,
Sensors.
Leopoldo Angrisani,
Francesco Bonavolontà,
Annalisa Liccardo,
2016,
2016 IEEE 2nd International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow (RTSI).
L. Angrisani,
A. Baccigalupi,
R. S. L. Moriello,
2004
.
Francesco Bonavolontà,
Annalisa Liccardo,
Rosario Schiano Lo Moriello,
2019,
2019 IEEE International Symposium on Measurements & Networking (M&N).
Michele Vadursi,
Leopoldo Angrisani,
Rosario Schiano Lo Moriello,
2005,
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510).
Francesco Bonavolontà,
Annalisa Liccardo,
Rosario Schiano Lo Moriello,
2020,
IEEE Instrumentation & Measurement Magazine.
Giancarmine Fasano,
Domenico Accardo,
Amedeo Rodi Vetrella,
2017,
2017 5th IEEE International Conference on Models and Technologies for Intelligent Transportation Systems (MT-ITS).
L. Angrisani,
A. Baccigalupi,
R. S. L. Moriello,
2006,
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510).