T. Colladant

Characterization of the parasitic bipolar transistor in SOI technology: comparison between direct and indirect triggering techniques

O. Flament, V. Ferlet-Cavrois, O. Musseau, 2000, 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125).

Investigation of SOI sensitivity to SEU-Influence of the buried oxide coupling effect

V. Ferlet-Cavrois, T. Colladant, A. L'Hoir, 2001, 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207).

Worst-case bias during total dose irradiation of SOI transistors

J. L. Pelloie, Marty R. Shaneyfelt, J. R. Schwank, 2000 .

Study of transient current induced by heavy-ion in NMOS/SOI transistors

O. Flament, V. Ferlet-Cavrois, T. Colladant, 2002 .