M. Thomason

A novel buried lightly doped drain CMOS design for optimizing hot carrier versus device performance

S. Steidley, M. Thomason, M. Nelson, 2005, 2005 IEEE Workshop on Microelectronics and Electron Devices, 2005. WMED '05..

Two-stage Hot Carrier Degradation of LDMOS Transistors.

P. Moens, F. Bauwens, M. Thomason, 2005, Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005..

Lithography CD Variation effects on LFNDMOS Transistor Hot-Carrier Degradation

F. Bauwens, M. Thomason, B. Greenwood, 2006, 2006 IEEE International Integrated Reliability Workshop Final Report.

Efficacy of fluorine doping at various stages on noise reduction

M. Thomason, B. Greenwood, K. Yokoyama, 2005, 2005 IEEE Workshop on Microelectronics and Electron Devices, 2005. WMED '05..

Lateral Extended Drain Transistor Reliability Dependence on Lithography CD Variation

M. Thomason, B. Williams, C. Belisle, 2007, 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

Photo sensitivities in a 0.35/spl mu/m 18V PDMOS technology

M. Thomason, B. Williams, C. Belisle, 2006, 2006 IEEE Workshop on Microelectronics and Electron Devices, 2006. WMED '06..

Unique technique to suppress reverse short channel effects in sub-micron CMOS devices

M. Thomason, J. De Greve, J. Prasad, 2005, 2005 IEEE Workshop on Microelectronics and Electron Devices, 2005. WMED '05..

Electrical characterization of dielectrics (oxide, nitride, oxy-nitride) for use in MIM capacitors for mixed signal applications

M. Thomason, M. Anser, J. Prasad, 2003, International Semiconductor Device Research Symposium, 2003.

Suppression of the reverse short channel effect in sub-micron CMOS devices

M. Thomason, J. De Greve, J. Prasad, 2003, International Semiconductor Device Research Symposium, 2003.