Saurabh Kumar

Towards a Nuclear Weapon Free World

Saurabh Kumar, 2010 .

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

James Tschanz, Heather Quinn, Shekhar Borkar, 2017, 2017 Symposium on VLSI Circuits.

An ultra-dense irradiation test structure with a NAND/NOR readout chain for characterizing soft error rates of 14nm combinational logic circuits

James Tschanz, Chris H. Kim, Shekhar Borkar, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).