Ken Uchida

Non-volatile Si quantum memory with self-aligned doubly-stacked dots

N. Sugiyama, A. Toriumi, J. Koga, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

Experimental study on carrier transport mechanism in ultrathin-body SOI nand p-MOSFETs with SOI thickness less than 5 nm

T. Numata, S. Takagi, K. Uchida, 2002, Digest. International Electron Devices Meeting,.

Experimental study on carrier transport mechanisms in double- and single-gate ultrathin-body MOSFETs - Coulomb scattering, volume inversion, and /spl delta/T/sub SOI/-induced scattering

Junji Koga, K. Uchida, S. Takagi, 2003, IEEE International Electron Devices Meeting 2003.