Paolo Spirito

发表

Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching

Andrea Irace, E. D'Arcangelo, Giovanni Breglio, 2004, Microelectron. Reliab..

Two-dimensional modeling of current gain in downscaled bipolar transistors

Paolo Spirito, Antonio G. M. Strollo, Niccolò Rinaldi, 1992 .

Achieving accuracy in modeling the temperature coefficient of threshold voltage in MOS transistors with uniform and horizontally nonuniform channel doping

Paolo Spirito, Vincenzo d'Alessandro, V. d’Alessandro, 2005 .

Educational issues for power semiconductor devices

Paolo Spirito, 1996 .

The bipolar mode FET: a new power device combining FET with BJT operation

Paolo Spirito, Antonio G. M. Strollo, G. V. Persiano, 1993 .

New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2007, Microelectron. Reliab..

A VLSI architecture for real time processing of one-bit coded SAR signals

Giorgio Franceschetti, Antonino Mazzeo, Nicola Mazzocca, 1998, 1998 URSI International Symposium on Signals, Systems, and Electronics. Conference Proceedings (Cat. No.98EX167).

New experimental results of optically activated BMFET switches with different cell design

Andrea Irace, Luigi Zeni, Antonello Cutolo, 1999 .

Two-dimensional modeling of on state voltage drop in IGBT

Paolo Spirito, Antonio G. M. Strollo, Ettore Napoli, 1997, 1997 21st International Conference on Microelectronics. Proceedings.

The bipolar mode field effect transistor (BMFET) as an optically controlled switch: numerical and experimental results

Antonello Cutolo, Giovanni Breglio, Paolo Spirito, 1996 .

Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2007, Microelectron. Reliab..

Analysis of second breakdown limits in RBSOA of bipolar transistors

Paolo Spirito, L. Fratelli, G. Busatto, 2002 .

A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2010, Microelectron. Reliab..

Two-dimensional analysis of the I-V characteristics of normally-off bipolar-mode FET devices

Paolo Spirito, Antonio G. M. Strollo, A. Caruso, 1990 .

A self-consistent model for the SIT DC characteristics

Paolo Spirito, Antonio G. M. Strollo, 1991 .

Effect of the Collector Design on the IGBT Avalanche Ruggedness: A Comparative Analysis Between Punch-Through and Field-Stop Devices

Luca Maresca, Andrea Irace, Giovanni Breglio, 2015, IEEE Transactions on Electron Devices.

Development of an electro-optic step-by-step sampling system for IC's close electro-magnetic field measurement

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2006, SPIE Photonics Europe.

Performance analysis of a Bipolar Mode JFET (BMFET) with normally off characteristics

Paolo Spirito, G. Busatto, G. F. Vitale, 1986 .

Experimental detection of time dependent temperature maps in power bipolar transistors

Giovanni Breglio, Paolo Spirito, 2000 .

Infrared thermal imaging of SiNx membranes

Andrea Irace, Pasqualina M. Sarro, Giovanni Breglio, 2000, SPIE Optics + Photonics.

Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography

Lucio Rossi, Michele Riccio, Andrea Irace, 2010, Microelectron. Reliab..

A new test structure for recombination measurements in thin si layers for VLSI structures

Paolo Spirito, S. Bellone, P. Spirito, 1990, Eur. Trans. Telecommun..

Detection of localized UIS failure on IGBTs with the aid of lock-in thermography

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2008, Microelectron. Reliab..

A quasi-one-dimensional analysis of vertical JFET devices operated in the bipolar mode

Paolo Spirito, G. F. Vitale, A. Caruso, 1983 .

Thermal mapping and 3D numerical simulation of new cellular power MOS affected by electro-thermal instability

Giovanni Breglio, Paolo Spirito, Niccolò Rinaldi, 2000 .

Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2006, Microelectron. Reliab..

3D electro-thermal simulations of wide area power devices operating in avalanche condition

E. Napoli, Michele Riccio, Luca Maresca, 2012, Microelectron. Reliab..

Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2005, Microelectron. Reliab..

A novel VLSI architecture for real time operations of one-bit coded synthetic radar imaging data

Giorgio Franceschetti, Antonio Iodice, Daniele Riccio, 1999, IEEE 1999 International Geoscience and Remote Sensing Symposium. IGARSS'99 (Cat. No.99CH36293).

Optical switching of bipolar-mode field effect transistors

Luigi Zeni, Antonello Cutolo, Giovanni Breglio, 1995, Other Conferences.

A new PiN diode modelling approach for power electronic PSPICE simulations

Paolo Spirito, Antonio G. M. Strollo, A. Strollo, 1994, Proceedings of 1994 Power Electronics Specialist Conference - PESC'94.

Simulation and analysis of silicon electro-optic modulator utilizing a three-terminal active device and integrated in a silicon-on-insulator low-loss single-mode waveguide

Luigi Zeni, Antonello Cutolo, Giovanni Breglio, 1997, Photonics West.

Fast power rectifier design using local lifetime and emitter efficiency control techniques

Paolo Spirito, Antonio G. M. Strollo, Ettore Napoli, 1999 .

Power semiconductor devices — continuous development

Ninoslav Stojadinovic, Paolo Spirito, 1996 .

Thermal transient mapping systems for integrated semiconductor devices and circuits.

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2006 .