A. Tsiamis
发表
J.T.M. Stevenson,
S. Smith,
A. Tsiamis,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
A. Tsiamis,
P. Sullivan,
M. Rondé,
2020,
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS).
A. Tsiamis,
E. O. Blair,
A. Buchoux,
2020,
IEEE Transactions on Semiconductor Manufacturing.
S. Smith,
A. Tsiamis,
M. McCallum,
2008,
IEEE Transactions on Semiconductor Manufacturing.
A. Walton,
J.T.M. Stevenson,
S. Smith,
2008,
2008 IEEE International Conference on Microelectronic Test Structures.
Stewart Smith,
Anthony J. Walton,
A. Tsiamis,
2010,
ICMTS 2010.
J.T.M. Stevenson,
A. Tsiamis,
S. Smith,
2007
.
A. Tsiamis,
M. McCallum,
A.C. Hourd,
2009,
2009 IEEE International Conference on Microelectronic Test Structures.
J.T.M. Stevenson,
S. Smith,
A. Tsiamis,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
Ndubuisi G. Orji,
Stewart Smith,
James E. Potzick,
2008,
ICMTS 2008.
J.T.M. Stevenson,
S. Smith,
A. Tsiamis,
2008,
2008 IEEE International Conference on Microelectronic Test Structures.
A. Tsiamis,
M. McCallum,
A.C. Hourd,
2009,
2009 IEEE International Conference on Microelectronic Test Structures.
J.T.M. Stevenson,
S. Smith,
A. Tsiamis,
2008,
2008 IEEE International Conference on Microelectronic Test Structures.
Stewart Smith,
Anthony J. Walton,
A. Tsiamis,
2009,
ICMTS 2009.
J.T.M. Stevenson,
S. Smith,
A. Tsiamis,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
Ndubuisi G. Orji,
Richard A. Allen,
James E. Potzick,
2007,
SPIE Photomask Technology.
A. J. Walton,
A. Tsiamis,
M. McCallum,
2009,
Photomask Technology.
Stewart Smith,
A. Tsiamis,
Brian Flynn,
2018
.
S. Smith,
A. Tsiamis,
M. McCallum,
2009,
IEEE Transactions on Semiconductor Manufacturing.
A. Tsiamis,
2010
.
S. Smith,
A. Tsiamis,
A. Buchoux,
2017,
2017 International Conference of Microelectronic Test Structures (ICMTS).
S. Smith,
A. Tsiamis,
A.J. Walton,
2017,
2017 International Conference of Microelectronic Test Structures (ICMTS).