C. Y. Hwang

Integrating a CBR Mechanism and ISO Standards for Dispute Resolution

C. Y. Hwang, N. J. Yau, 2014 .

Extraction of gate dependent source/drain resistance and effective channel length in MOS devices at 77 K

Jason C. S. Woo, C. Y. Hwang, Tsung-Chia Kuo, 1995 .