D.M. Hiemstra

Guide to the IEEE Radiation Effects Data Workshop

D.M. Hiemstra, 2006, 2006 IEEE Radiation Effects Data Workshop.

Guide to the 2006 IEEE Radiation Effects Data Workshop Record

D.M. Hiemstra, 2007, 2007 IEEE Radiation Effects Data Workshop.

Part II. Dynamic single event upset characterization of the Virtex-II field programmable gate array using proton irradiation

D.M. Hiemstra, F. Chayab, 2005, IEEE Radiation Effects Data Workshop, 2005..

Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation

D.M. Hiemstra, F. Chayab, L. Szajek, 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).

Dynamic single event upset characterization of the Virtex-IIPro's embedded IBM PowerPC405 using proton irradiation

D.M. Hiemstra, F. Chayab, R. Ronge, 2005, IEEE Radiation Effects Data Workshop, 2005..

Dynamic Single Event Upset Characterization of the MT48LC4M32B2TG-6 SDRAM Using Proton Irradiation

D.M. Hiemstra, F. Pranajaya, 2007, 2007 IEEE Radiation Effects Data Workshop.

Single event upset characterization of the ESP603 single board space computer with the PowerPC603r processor using proton irradiation

D.M. Hiemstra, H. Rufenacht, R. Ronge, 2005, IEEE Radiation Effects Data Workshop, 2005..