V. Kraz

Notes on maintaining sub-1V balance of an ionizer

V. Kraz, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

The effects of EMI from cell phones on GMR magnetic recording heads and test equipment

V. Kraz, A. Wallash, A. Wallash, 2000, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).

Controlling ESD damage of ICs at various steps of back-end process

V. Kraz, J. Marley, D. Tan, 2001, 2001 Electrical Overstress/Electrostatic Discharge Symposium.

A comparison of high-frequency voltage, current and field probes and implications for ESD/EOS/EMI auditing

V. Kraz, A. Wallash, 2007, 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

EOS exposure of magnetic heads and assemblies in automated manufacturing

V. Kraz, P. Tachamaneekorn, D. Napombejara, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

A low power, high performance, phone headset amplifier in CMOS technology

V. Kraz, M. Negahban-Hagh, R. Stolaruk, 1988, Proceedings of the IEEE 1988 Custom Integrated Circuits Conference.