Arthur F. Witulski

Test Circuit for Measuring Pulse Widths of Single-Event Transients Causing Soft Errors

Bharat L. Bhuva, B. Narasimham, Lloyd W. Massengill, 2009 .

Total dose effects on power-MOSFET switching converters

Ronald D. Schrimpf, Kenneth F. Galloway, Arthur F. Witulski, 1998 .

A unified treatment of a family of ZVS and ZCS resonant inverters

Arthur F. Witulski, Y. L. Lin, 1997, PESC97. Record 28th Annual IEEE Power Electronics Specialists Conference. Formerly Power Conditioning Specialists Conference 1970-71. Power Processing and Electronic Specialists Conference 1972.

Small signal ac equivalent circuit modelling of the series resonant converter

Robert W. Erickson, Arthur F. Witulski, A. Witulski, 1987, IEEE Power Electronics Specialists Conference.

Single-Event Burnout Mechanisms in SiC Power MOSFETs

Kenneth F. Galloway, Ronald D. Schrimpf, Jean-Marie Lauenstein, 2018, IEEE Transactions on Nuclear Science.

Characterization and comparison of noise generation for quasi-resonant and pulse-width modulated converters

Arthur F. Witulski, M. Goldman, L. Hsiu, 1991 .

Effects of Proton-Induced Displacement Damage on Gallium Nitride HEMTs in RF Power Amplifier Applications

Lloyd W. Massengill, En Xia Zhang, Ronald D. Schrimpf, 2015, IEEE Transactions on Nuclear Science.

Experimental Characterization of Radiation-Induced Charge Sharing

Nicholas C. Hooten, Ronald D. Schrimpf, William G. Bennett, 2013, IEEE Transactions on Nuclear Science.

Model-Based Assurance for Satellites with Commercial Parts in Radiation Environments

Gabor Karsai, Kenneth A. LaBel, R. D. Schrimpf, 2018 .