R. R. Chaudhuri

Physical Insights Into Nano-Second Time Scale Cyclic Stress Induced Dynamic Ron Behavior in AlGaN/GaN HEMTs—Part I

M. Shrivastava, Vipin Joshi, Amratansh Gupta, 2023, IEEE Transactions on Electron Devices.

On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs

Sayak Dutta Gupta, Mayank Shrivastava, Vipin Joshi, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).