Yuchul Hwang

Oterkus, Selda and Madenci, Erdogan and Oterkus, Erkan and Hwang, Yuchul and Bae, Jangyong and Han, Sungwon (2014) Hygro-thermo- mechanical analysis and failure prediction in electronic packages by using peridynamics. In: 2014 IEEE 64th Electronic Components

Selda Oterkus, Erkan Oterkus, Yuchul Hwang, 2018 .

Correction to “Generation Dependence of Retention Characteristics in Extremely Scaled NAND Flash Memory” [Sep 13 1139-1141]

Hyungcheol Shin, Dong Hua Li, Yuchul Hwang, 2013 .

Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory

Hyungcheol Shin, Sangjin Kwon, Kyunghwan Lee, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Modeling of apparent activation energy and lifetime estimation in NAND flash memory

Myounggon Kang, Hyungcheol Shin, Yuchul Hwang, 2015 .

Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

Myounggon Kang, Hyungcheol Shin, Yuchul Hwang, 2014, IEEE Electron Device Letters.

Chip package interaction in micro bump and TSV structure

Yuchul Hwang, Hyoung-Sub Kim, Ha-Young You, 2012, 2012 IEEE 62nd Electronic Components and Technology Conference.

Analysis of read disturbance mechanism in retention of sub-20 nm NAND flash memory

Hyungcheol Shin, Yuchul Hwang, Duckseoung Kang, 2015 .

Generation Dependence of Retention Characteristics in Extremely Scaled NAND Flash Memory

Hyungcheol Shin, Yuchul Hwang, Dong Hua Li, 2013, IEEE Electron Device Letters.