K. LaBel

SEU tests of a 80386 based flight-computer/data-handling system and of discrete PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and ASICs

E.G. Stassinopoulos, K. LaBel, G.J. Brucker, 1992, Workshop Record 1992 IEEE Radiation Effects Data Workshop.