K. Chatty
发表
M. Muhammad,
R. Gauthier,
K. Chatty,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
K. Chatty,
V. Bondarenko,
D. C. Sheridan,
2012,
2012 24th International Symposium on Power Semiconductor Devices and ICs.
R. Gauthier,
K. Chatty,
Junjun Li,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
K. Chatty,
E. Rosenbaum,
J. Di Sarro,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
M. Muhammad,
R. Gauthier,
K. Chatty,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
K. Chatty,
C. Seguin,
R. Halbach,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
K. Chatty,
D. Harame,
E. Seebacher,
2010,
2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD).
M. Muhammad,
R. Gauthier,
K. Chatty,
2005,
2005 Electrical Overstress/Electrostatic Discharge Symposium.
K. Chatty,
C. Seguin,
R. Halbach,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
M. Muhammad,
R. Gauthier,
K. Chatty,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
M. Muhammad,
R. Gauthier,
K. Chatty,
2003,
2003 IEEE International Conference on SOI.
M. Muhammad,
R. Gauthier,
K. Chatty,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
Investigation of ESD performance of silicide-blocked stacked NMOSFETs in a 45nm bulk CMOS technology
R. Gauthier,
K. Chatty,
C. Russ,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
R. Gauthier,
K. Chatty,
E. Rosenbaum,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
R. Gauthier,
K. Chatty,
C. Seguin,
2006,
2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
R. Gauthier,
K. Chatty,
C. Russ,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
R. Gauthier,
K. Chatty,
S. Mitra,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
R. Gauthier,
K. Chatty,
S. Mitra,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
R. Gauthier,
K. Chatty,
C. Seguin,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.