C. Seguin
发表
M. Muhammad,
R. Gauthier,
K. Chatty,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
R. Gauthier,
K. Chatty,
Junjun Li,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
K. Chatty,
C. Seguin,
R. Halbach,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
R. Gauthier,
C. Seguin,
S. Mitra,
2006,
2006 IEEE international SOI Conferencee Proceedings.
K. Chatty,
C. Seguin,
R. Halbach,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
R. Gauthier,
C. Seguin,
S. Mitra,
2005,
2005 IEEE International SOI Conference Proceedings.
C. Seguin,
Kiran V. Chatty,
R. Halbach,
2007
.
R. Gauthier,
C. Seguin,
S. Mitra,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
M. Muhammad,
R. Gauthier,
K. Chatty,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
R. Gauthier,
K. Chatty,
C. Seguin,
2006,
2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
R. Gauthier,
K. Chatty,
C. Seguin,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
Souvick Mitra,
C. Seguin,
Dimitris E. Ioannou,
2007
.