K. Morikawa
发表
A. Miura-Mattausch,
S. Matsumoto,
K. Mizoguchi,
2004,
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).
Shaobo Li,
K. Nakamura,
T. Kawabe,
2012,
2012 Proceedings of SICE Annual Conference (SICE).